Catalogs

Tables of measurements made on sources and objects detected in the processed images, and tables of survey metadata for the observations.

The schema browser includes column descriptions for all tables.

Catalog data products are available via TAP, and most are also available with the Butler. See the following resources to get started with these services:

• Data access and analysis

• TAP terminology and query tips

• Butler terminology and query tips

Object

Measurements on the deep coadd images at the locations of all detected objects.

• Object

Source and forced source

Measurements on the individual images at the locations of all objects.

• Source
• Forced source

Difference image analysis

Measurements on the difference and visit images at the locations of all variable or moving objects.

• DIA object
• DIA source
• DIA forced source

Moving objects

Derived properties for moving objects detected in images.

• SS object
• SS source
• MPCORB

Observations

Observational metadata for visits and detectors.

• Visit
• Visit detector (CcdVisit)